Variable Angle Specular Reflectance Accessory, Model: VeeMAX III

Description

Product Overview

The VeeMAX III, manufactured by PIKE Technologies, is a variable-angle specular reflectance accessory designed for FTIR spectrometers. Its all-reflective optical system enables adjustable incidence angles for the analysis of surfaces, thin films, and coatings. With interchangeable ATR crystal plates, it also supports single-reflection ATR measurements and depth profiling. The accessory can be integrated with compatible in situ infrared spectroelectrochemical cells for investigating electrode interfaces and reaction intermediates.

Key Features

• Variable-Angle Optical Control: Continuously adjustable incidence angles from 30° to 80° in 1° increments enable flexible optimization of infrared measurement conditions.
• High-Throughput Optical Design: An all-reflective, enclosed optical system supports efficient infrared signal collection and optical purging to reduce atmospheric interference.
• Flexible ATR and Sampling Options: Interchangeable ATR crystal plates, optional polarizers, and pressure clamps support a range of sample types and measurement configurations.

Working Principle

The VeeMAX III uses a mirror-based optical system to direct and focus the infrared beam onto the sample. Adjusting the optical angle changes the incidence angle for specular reflectance measurements. With an optional ATR crystal plate, single internal reflection generates an evanescent field for depth-sensitive infrared analysis.

Technical Specifications

Measurement modes	Specular reflectance; optional single-reflection ATR
Incidence angle	30°–80° (continuously adjustable)
ATR crystal options	ZnSe, Ge, Si, ZnS
Optical throughput	>50% with a 45° ZnSe crystal*
ATR penetration depth	0.4–46 μm*
Accessory dimensions	W177 × D92 × H162 mm

*Optical throughput and ATR penetration depth depend on the crystal configuration, incidence angle, and measurement conditions.

Electrochemical Cell Compatibility

• EC-IR1 — Internal Reflection (ATR-SEIRAS): Supports surface-sensitive infrared measurements using an Au-coated single-crystal Si working substrate.
• EC-IR2 — External Reflection (IRRAS): Supports external-reflection infrared measurements using a micrometer-adjustable glassy carbon working electrode.

Typical Applications

• Thin-Film and Coating Analysis: Infrared characterization of thin films, coatings, and reflective surfaces at adjustable incidence angles.
• Surface and Monolayer Studies: Investigating molecular adsorption, surface layers, and polymer orientation using reflectance and optional polarized measurements.
• ATR Depth Profiling: Characterizing layered solids, films, liquids, and powders using suitable ATR crystals and sample holders.
• In Situ Electrochemical IR Studies: Investigating electrochemical interfaces and reaction intermediates using compatible in situ infrared spectroelectrochemical cells.

Notes

• The VeeMAX III is sold separately from the EC-IR1 and EC-IR2 cells.
• ATR crystals, polarizers, and pressure clamps are optional; configurations should be confirmed when ordering.
• Optical performance varies with measurement conditions. Please specify the FTIR spectrometer brand and model to confirm compatibility.